Tag: NXHivac
Park Systems Introduces Park NX-Hivac, a High Vacuum SSRM AFM System for Optimal Results in Semiconductor Manufacturing Failure Analysis
Santa Clara CA (PRWEB) May 06, 2015 Park Systems, world-leader in atomic force microscopy (AFM) today announced NX-Hivac, the only high vacuum AFM system in the market that meets the current and future needs for failure analysis semiconductor manufacturing. Park NX-Hivac is ideal for academic and industrial customers who are interested in failure analysis solutions […]