Tag: Roughness
Park Systems Announces Live Demo of Surface Roughness Measurement with AFM Using Non-contact Mode Imaging will be Sept 25, 2014 9am PST
Santa Clara, CA (PRWEB) September 22, 2014 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products will be hosting a live demonstration on Sept 25, 2014 via internet at 9 am PST on how to do Surface Roughness Measurements with AFM Using Non-Contact Mode Imaging for Angstrom Level Roughness Measurement. This demo is […]